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Layout and process design
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Analysis and testing
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简体中文
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Home
Solution
Layout and process design
Project collaboration and processing
Analysis and testing
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简体中文
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产品
分类
Semiconductor materials
Device fabrication
Testing and analysis
Testing products
产品
Visual Check: Cross-section
Visual Check: De-capsulation
Visual Check: AOI
Equipment Name :SAT (Scanning Acoustic Microscope)
Equipment Name :X-ray(CT)
Other substrate materials; glass
Epitaxial wafer
SOI wafer
SiN(Si₃N₄)
SiO2 wafer
Test Wafer
Prime Wafer
Detection and Analysis
semiconductor materials
KG Bright Field XY Standard Film
KG Step Height Film
CD & Checkerboard & OVL
100nm CDSEM
12-inch 3D solder ball plate